DC calibration system for a digital-to-analog converter

ABSTRACT

A calibration system for a digital-to-analog converter (DAC) includes a digital portion (10) having a interpolation section (14) for receiving the digital input and increasing the sampling frequency thereof for input to a delta-sigma modulator (16). A summing junction (24) is disposed between the interpolation circuit (14) and the delta-sigma modulator (16) to allow an offset voltage to be summed therewith. The offset value is stored in an offset register (26), which is controlled by a calibration control circuit (40). The output of the delta-sigma modulator (16) is input to an analog section (12), which is comprised of an analog filter (22) and an output amplifier (28). The output amplifier (28) is operable to sample the output of the analog filter (22) and feed this back to a gate (38). The gate (38) is activated during a calibration cycle to feed the comparator output back to the calibration control circuit (40). During the calibration cycle, the output is isolated by an isolation amplifier (32 ) and the analog output pad connected to ground by a switch (44) to provide a low impedance output on the analog output. The calibration control circuit (40) is operable to perform a binary search while sampling the output of the analog section (12) with the input to the interpolation circuit (14) forced to a logic low.

TECHNICAL FIELD OF THE INVENTION

The present invention pertains in general to digital-to-analogconverters, and more particularly, to a calibration system for removingthe DC offset from the digital-to-analog converter, and its associatedanalog reconstruction filter.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is related to U.S. Pat. application Ser. No.07,571,376, filed concurrent herewith.

BACKGROUND OF THE INVENTION

In the digital audio and telecommunications fields, the high accuracyand high resolution digital-to-analog conversion (DAC) technology hasbecome one of the key analog circuit technologies. Conventionally,either the weighted network circuit technique with trimming, or themultislope integration technique has been utilized for high resolutionDACs. In the weighted network, some trimming of the weighted networkutilizing a laser, dynamic element matching, or the digital methodutilizing Read-Only Memory (ROM), was required. This is due to theconversion accuracy, which depended in large part on the device matchingtolerance of the weighted network. Typically, untrimmed weightednetworks would yield a fourteen bit accuracy, whereas the trimmednetwork could attain a conversion accuracy of over fifteen bits. In themultislope integration circuit technique, on the other hand,integrators, sample and hold circuits and current sources are required,which of necessity must be high speed devices with relatively highaccuracy. High resolution DACs utilizing this technology are difficultto realize due to the sample charge and the sample capacitor leakingthrough the base impedance of the transistors, which typically usebipolar technology.

Another technique that has come to the forefront in DAC technology isthat utilizing oversampling conversion techniques. These typicallyutilize a delta-sigma modulator in conjunction with conventionaloversampling noise shaping techniques utilizing digital filters.Typically, an interpolation filter is utilized to increase the samplerate and then filter all images and quantization noise at F_(s) /2 andabove, F_(s) being the input sampling frequency. The output of theinterpolation filter is then processed through a sample and hold circuitto provide the oversampled output. If the interpolation filter providesa factor of 8x increase in the sampling rate, the sample and holdcircuit could provide another 8x of increase to result in a total of 64xof oversampling. The delta-sigma modulator receives the output of thecombined interpolation filter and sample and hold circuit and convertsthis oversampled signal into a one-bit data stream. This one-bit outputcontrols a DAC, which has only two analog levels and, therefore, isinherently linear. This signal is then input to an analog low passfilter.

With the oversampling noise shaping techniques utilized with highresolution DACs, two problems have been recognized--DC offset and phaselinearity. The digital portion of the DAC comprising the interpolationfilter, sample and hold circuit and the delta-sigma modulator can bedesigned such that they are substantially phase linear, and DC offsetcan also be provided. However, when the analog portion of the overallDAC system is implemented, i.e., the analog low pass filter, anadditional level of DC offset may be introduced into the system inaddition to a phase response non-linearity. It is very difficult toremove DC offset and provide a linear phase response in the analogportion of the DAC converter system. In applications such as digitalaudio, this DC offset and phase response linearity is audible anddetracts from the high quality of audio that is desired. In view ofthese disadvantages, it is desirable to provide a DAC system thatprovides a method to calibrate the DC offset for the combineddigital-to-analog portions of the DAC system, and also provide anoverall phase linearity for the system.

SUMMARY OF THE INVENTION

The present invention as disclosed and claimed herein comprises adigital-to-analog converter with an integrated calibration system forcalibration of D.C. offset. The system includes a digital-to-analogconverter for receiving a digital input signal and outputting an analogoutput signal having an analog level corresponding to the value of thedigital input signal. An offset circuit is provided for offsetting theanalog level by an offset value for a given digital input value.Calibration circuitry is provided to determine the offset value inresponse to the generation of a calibration signal. The offset signal isset by the calibration circuitry such that a predetermined digital inputvalue on the digital input will result in the output of a predeterminedanalog output value.

In another aspect of the present invention, the calibration circuit isoperable to determine the offset value by sampling the analog outputsignal with the predetermined digital value input on the digital input,and varying the offset value until the analog output signal issubstantially equal to the predetermined analog output value. The offsetvalue is a digital value which is stored in an offset register. Asumming junction is provided on the input to the digital-to-analogconverter, which is operable to receive the digital input signal and theoutput of the offset register.

In a further aspect of the present invention, the calibration circuitforces the input to the digital-to-analog converter to a substantiallyzero digital input value. The output of the digital-to-analog converteris then sampled, and the offset value in the register varied until theanalog output value is substantially equal to zero. An amplifier capableof being enabled and disabled is provided for isolating the analogoutput of the digital-to-analog converter from an analog output pad anda switch is provided for disposing the analog output pad at apredetermined voltage during the calibration procedure.

In a yet further aspect of the present invention, the digital-to-analogconverter includes an interpolation filter for increasing the samplingrate of the digital-to-analog converter and outputting the interpolateddigital value to a delta-sigma modulator for converting the signal to aone-bit digital stream, which is then input to a one-bit DAC. An analoglow pass filter is provided for filtering the one-bit DAC to provide theanalog output value.

BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding of the present invention and theadvantages thereof, reference is now made to the following descriptiontaken in conjunction with the accompanying Drawings in which:

FIG. 1 illustrates a block diagram of the digital and analog portions ofthe DAC system with the calibration control and offset register;

FIG. 2 illustrates a block diagram of the interpolation filter and thesample and hold circuit;

FIG. 3 illustrates a block diagram of the delta-sigma modulator;

FIGS. 4, 4a and 4b illustrate schematic diagrams of the switchedcapacitor filter and continuous time filter that comprise the analog lowpass filter;

FIG. 5 illustrates a logic diagram for the calibration control systemand offset register; and

FIG. 5a illustrates a timing diagram for the calibration circuit.

DETAILED DESCRIPTION OF THE INVENTION

Referring now to FIG. 1, there is illustrated a digital-to-analogconverter system (DAC). The DAC system is comprised of a digital portion10 and an analog portion 12. The digital portion 10 is comprised in partof an interpolation circuit 14, that includes an interpolation filterand a sample and hold circuit. The digital portion 10 also includes adelta-sigma modulator 16. The digital portion effectively converts thedigital input signal on an input 18 to a one-bit digital stream on anoutput 20. The output 20 is input to the analog portion 12, analogportion 12 being generally comprised of a one-bit DAC 21 and an analoglow pass filter 22. Although a delta-sigma modulator is illustrated, itshould be understood that any type of one-bit quantizer or equivalentcan be utilized to provide the conversion to a one-bit digital stream.The delta-sigma modulator is utilized as it provides good low levelperformance and differential non-linearity. The general operation of thedigital portion 10 is known in the art and described in YasuykuiMatsuya, Kuniharu Uchimura, Atsushi Awaiti and Takayo Kaneko, "A 17-BitOversampling D-to-A Conversion Technology Using Multi-Stage NoiseShaping", IEEE J. of Solid-State Circuits, Vol. 24, No. 4, August 1989,which is incorporated herein by reference.

The output of the interpolation circuit 14 is connected to the input ofa summing circuit 24, the output of which is connected to the input ofthe delta-sigma modulator. The other input of the summer 24 is connectedto the output of an offset register 26. The contents of the offsetregister 26 provide a DC offset that is utilized to correct for any DCdrift problems that may occur throughout the system illustrated inFIG. 1. As will be described hereinbelow, the contents of the offsetregister 26 are determined by an internal calibration scheme.

The analog filter 22 in the analog portion 12 has an amplifier 28provided on the output thereof. The positive input of the amplifier 28is connected to ground and the negative input thereof is connectedthrough a resistive element 30 to the output of the analog filter 22.The output of amplifier 28 is connected to the input of a second stageof amplification 32, which provides a disable feature, the output ofsecond stage 32 connected to the analog output pad associated with anode 34. A resistive element 36 is illustrated as being connectedbetween the negative input of the amplifier 28 and the node 34. Theoutput of amplifier 28 is input to one input of a gate circuit 38, theoutput of which is connected to an input of a calibration controlcircuit 40. The other input of the gate 38 is connected to a CAL/SQUELCHsignal output by the calibration control circuit 40. The calibrationcontrol circuit 40 is operable to set the contents of the offsetregister 22 to an offset value. The calibration control circuit 40 alsoreceives a digital input 18 and a reset input. The calibration controlcircuit 40 also outputs a control line to the interpolation circuit 14to force the output thereof to all zeroes during a calibration cycle.For calibration purposes, a switch 44 is provided on the analog outputbetween node 34 and ground. When node 34 is grounded, resistor 36 isalso grounded through switch 44, this causing amplifier 28 to run "openloop" and function as a comparator.

In operation, the calibration control circuit 40 is operable to initiatean internal calibration procedure that first forces the output of theinterpolation circuit 14 to an all zero state, and then sets thecontents of the offset register 26 to a predetermined value. Thisprovides the primary input to the delta-sigma modulator 16. The outputof the amplifier 28 is then sampled by the calibration control circuit40 to determine if the output of the analog filter 22 is above zero. Ifthe output of the analog filter 22 is above zero, the output of theamplifier 28 will be at a logic zero. When the output of analog filter22 falls below zero, the output of amplifier 28 will go to a logic "1".The contents of the offset register 26 are varied through a range ofvalues until the transition on the output of the amplifier 28 is found,thus indicating the proper offset to result in a zero output from analogfilter 22 with a zero input from the interpolation circuit 14. Duringthe calibration procedure, the switch 44 is closed and the outputamplifier 32 has the output thereof disabled. Although the summingcircuit 24 is illustrated as being disposed between the interpolationcircuit 14 and the input of the delta-sigma modulator 16, it should beunderstood that the summing circuit could be placed on the digital inputto the interpolation circuit 14. However, it has been determined thatfrom a circuit design standpoint the offset operation should be disposedbetween the interpolation circuit and the delta-sigma modulator 16.

Referring now to FIG. 2, there is illustrated a block diagram of theinterpolation circuit 14 including the interpolation filter and thesample and hold circuit. The interpolation filter is illustrated in athree-stage topology, a 2x interpolation filter 50, that is a onehundred twenty-five tap half band filter, a 2x interpolation filter 52,that is a twenty-four tap filter and a 2X interpolation filter 54, thatis a four tap filter. The interpolation filter 50 is operable toincrease the sampling frequency for an eighteen-bit 48 Khz input signalto an eighteen-bit 96 kHz signal. The interpolation filter 52 isoperable to increase the sampling frequency from 96 kHz to 192 kHz andthe 2x interpolation filter 54 is operable to transform the 192 kHz rateto a 384 kHz rate. The three stage topology was chosen for area andcomputation efficiency. As described in a co-pending application, theinterpolation filter 52 is utilized to compensate for the phase andfrequency response of the analog filter 22 in the analog section 12.However, all three interpolation filters 50, 52 and 54 could be utilizedto provide compensation for this phase and frequency response.Substantial computation savings (i.e., number of multiplications persecond) are realized by implementing the interpolation filter 50 with ahalf band filter, wherein every other coefficient is zero. Theinterpolation filters 52 and 54 are also realized with FIR filters, witheach of the FIR filters having the associated filter coefficients storedin a memory 56.

Each of the FIR filters is realized utilizing a digital signalprocessing unit (DSP) that is essentially an arithmetic logic unit(ALU), which has the inputs thereof multiplexed to perform thecalculations necessary to realize the filter function. Typically,digital filters are comprised of a series of multiplication andaddition/subtraction steps which must be executed in a predeterminedorder, which order is sequential. Therefore, the digital input valuesare processed through each of the FIR filters 50-54 in accordance withthe coefficients stored in the memory 56. This provides the filteringand interpolation function for output from the third stage interpolationfilter 54.

The 384 kHz output from the third stage interpolation filter 54 is inputto an 8x sample and hold circuit 58, which is operable to increase thesampling frequency to 3.072 MHz. This is then input to the summingjunction 24. In addition, a control line 60 is received from thecalibration control 40. The control line 60 is operable to force theoutput of the sample and hold circuit 58 to an "all zeroes" state forthe purpose of calibration, which will be described in more detailhereinbelow.

Referring now to FIG. 3, there is illustrated a block diagram of thedelta-sigma modulator 16 that converts the eighteen-bit digital signalto a one-bit digital stream. The signal output by the summing junction24 is input to a summing junction 62 and then to a first stage ofintegration 64. The output of the first stage of integration 64 is inputto a summing junction 66, the output of which is input to a second stageof integration 68. The output of the second stage of integration isinput to the input of a third stage of integration 70. The output of thethird stage of integration is input to a summing junction 72, the outputof which is input to the input of a fourth stage of integration 74. Theoutput of the fourth stage of integration 74 is input to the input of afifth stage of integration 76. The output of each of the stages ofintegration 64, 68, 70, 74 and 76 are input to a summing junction 80through feed forward paths 82, 84, 86, 88 and 90, respectively, eachhaving coefficients a₁, a₂, a₃, a₄ and a₅, respectively. The output ofthe fifth stage of integration 76 is input to the summing junction 72along a negative feedback path 92, having a coefficient b₂ associatedtherewith. A negative sign on the input to the summing junction 72indicates a subtraction process. In addition, the output of the fifthstage of integration 76 is also input along a positive feedback path 94to the input to the summing junction 72 and having a coefficient b₃associated therewith. A positive sign is indicated on the input of thefeedback path 94 to the summing junction 72 to indicate the additionoperation. A feedback path 96 is provided for connecting the output ofthe third stage of integration to the input of summing junction 66 atthe input of the second stage of integration 68, the feedback path 96being a negative feedback path and having a coefficient b₁ associatedtherewith.

The output of the summing junction 80 is input to a one-bit quantizer 98that converts the output of summing junction 80 into a signal that isplus or minus full scale. The output of the quantizer 98 is passedthrough a delay transfer function 100 to provide the output on a line102. The output on line 102 is also input back through a function block103 having a coefficient g to the input of the summing block 62 to sumwith the digital input signal to the delta-sigma modulator 16. Thestructure of FIG. 3, therefore, realizes a fifth order delta-sigmamodulator. The coefficients for the fifth order modulator illustrated inFIG. 3 are listed in TABLE 1.

                  TABLE 1                                                         ______________________________________                                        Delta-Sigm Modulator Coefficients                                             ______________________________________                                        k.sub.1                                                                             1          a.sub.1                                                                             1       b.sub.1                                                                            1/1024                                    k.sub.2                                                                             1          a.sub.2                                                                             1/2     b.sub.2                                                                           1/16                                       k.sub.3                                                                             1/2        a.sub.3                                                                             1/4     b.sub.3                                                                           1/64                                       k.sub.4                                                                             1/4        a.sub.4                                                                             1/8     g   2.5                                        k.sub.5                                                                             1/8        a.sub.5                                                                             1/8                                                    ______________________________________                                    

Referring now to FIG. 4, there is illustrated a schematic block diagramof the analog section 12 including the analog filter 22. The analogfilter 22 is comprised of two sections, a switched capacitor filter 106,and a continuous time filter section 108. The switched capacitor filtersection 106 comprises a fourth order Butterworth low-pass filter,whereas the continuous time filter section 108 is comprised of a secondorder Butterworth low-pass filter.

The switched capacitor filter section 106 is comprised of four switchedcapacitor stages, 110, 112, 114 and 116. The analog input is input tothe positive input of a summing junction 118, the output of which isconnected to the input of the first switched capacitor stage 110. Theoutput of the switched capacitor stage 110 is input to the positiveinput of a summing junction 120. The output of summing junction 120 isinput to the input of the second switched capacitor stage 112, theoutput of which is connected to the positive input of summing junction122. The output of summing junction 122 is input to the input of thethird switched capacitor stage 114, the output of which is connected tothe positive input of a summing junction 124. The output of summingjunction 124 is input to the input of a switched capacitor stage 116,the output of which is connected to a node 126. Node 126 is fed back tothe negative inputs of each of the summing junctions 118, 120, 122 and124.

The continuous time filter section 108 has the input thereof connectedto node 126, node 126 being connected through a resistor 128 to a node130. A capacitor 132 has one plate thereof connected to node 130, andthe other plate thereof connected to ground. Node 130 is connectedthrough a resistor 134 to the negative input of an amplifier 136, thepositive input of which is connected to ground. The amplifier 136 isessentially an op amp for the purposes of realizing the filter. Theoutput of the amplifier 136 is connected to the analog output pad atnode 138. Node 138 is connected through a series capacitor 140 to thenegative input of the amplifier 136. Node 138 is also connected througha resistor 142 to the node 130. A switch 144 is connected between theanalog output pad at node 138 to ground. A control signal CAL/SQUELCH isinput on a line 136 to both the amplifier 136 and the switch 144. Aswill be described hereinbelow, the control line 146 is operable todisable the output of the amplifier 136 from the analog output node 138and also close switch 144 during a calibration operation. This willcause the first stage of amplifier 136 to function as a comparator.

Referring now to FIG. 4a, there is illustrated a more detailed view ofthe amplifier 136. The amplifier 136 is comprised of a first stage 148and an output stage 150. The output stage 150 has two CMOS transistors152 disposed therein, one having the source/drain path connected betweenthe positive supply and the output node 138 and one transistor havingthe source/drain path connected between the node 138 and ground. Thetransistors 152 are controlled by the CAL/SQUELCH signal on line 146 toisolate the node 138 from the output of first stage 148. The output ofstage 148 provides the comparator operation, which output is connectedto one input of the gate 38. The other input of gate 38 is connected tothe line 146. Therefore, when the calibration operation is initiated,switch 144 is closed and node 138 is grounded.

Referring now to FIG. 4b, there is illustrated a detail of each of theswitched capacitor stages 110-116. Each of the stages is comprised of anamplifier stage 143, having a feedback capacitor 145 disposed betweenthe negative input thereof and the output. A switched capacitor 147 isprovided on the input, which is connected from the output of thepreceding one of the summing junctions 118-124 with appropriate switchesdisposed thereabout. The switches are controlled by signals φ₁ and φ₂.In a similar manner, the feedback leg has a switched capacitor 149disposed in series therewith and input to the negative input of theamplifier 143. Similar switches are provided in a switched capacitorconfiguration and controlled by the timing signals φ₁ and φ₂. This is aconventional structure.

Referring now to FIG. 5, there is illustrated a block diagram of acalibration control circuit 40. The offset register is a 16 bitregister. A successive approximation controller 154 is provided and isoperable to interface with the offset register 26. The offset register26 has the 16 bits thereof extending from an LSB to an MSB. Thesuccessive approximation controller 154 is operable to either reset eachof the bits in the offset register 26 to a logic "0" or to set each ofthe bits to a logic "1". The successive approximation controller 154 isoperable to initially reset all of the registers in the offset register26 to a logic "0" and then successively set each bit high, beginningwith the MSB, wait for a reset signal, if appropriate, at the end of acycle, which when it occurs will reset the bit back to zero, and thencycle to the next lower bit. The CAL/SQUELCH signal is input to thesuccessive approximation controller 154 on the line 146 to initiate theoperation.

A ten-bit counter 156 is provided having two enable inputs, ENl and EN2,which are operable to enable the counter 156. The enable input ENI isconnected through a line 159 to an output from the successiveapproximation controller 154. The signal output on line 159 is generatedby an internal counting circuit 160. A reset signal is output by thesuccessive approximation controller 154 on a line 162 to reset theten-bit counter for each bit tested by the successive approximationcontroller 154. The MSB of the counter 156 is provided as an output on aline 164 to a reset input on the successive approximation controller154. As will be described hereinbelow, a line 164 and the signal thereonare operable to prevent the bit being tested from being reset to a logic"0". The comparator output on the line 158 is input to the EN2 enableinput and, when combined with the clock input, increments the counter156. The clock input is connected to a signal that is 64 times thesampling frequency F₈.

Referring now to FIG. 5a, there is illustrated a timing diagram for thecalibration operation. The CAL/SQUELCH signal is represented by a signal166, the rising edge of which initiates the calibration procedure. Thecontroller 154 MSB is represented by a second pulse 167 that follows thepulse 166. A counter reset signal 169 is generated at the same time asthe pulse 167, and is output on line 162 to the counter 156 to reset thecount value therein to zero. The ENI enable input to counter 156 on line159 is maintained at a low level for a predetermined settling time 168.This settling time is provided to allow the DAC to settle for apredetermined amount of time after a new input value has been applied tothe input of the DAC, this input being all logic "0"s at the input tothe summing junction 24. Typically, the analog low pass filter 22 is theprimary circuit component that accounts for this need. The enable line159 then goes high, as represented by a pulse 165, for 1024 clockcycles, this being the same clock that is input to the ten-bit counter156. The counting function is provided by counter 160. At the end of the1024 clock cycles, the counter MSB line 164 is sampled as a resetsignal, which when it is high, does not reset the particular bit. Thereset function occurs at a pulse 163 which, if the counter MSB is low,results in the resetting of the bit to zero. Thereafter, the nextadjacent bit to the MSB is set, the DAC allowed to settle for the offsetsettling time indicated by reference number 168, and then the comparatoroutput sampled over 1024 clock cycles. This continues for all sixteenbits.

The successive approximation controller in a second mode is allowed toreceive a signal on a Preset input 161. The Preset input 161 forces abit other than the MSB bit to be the first bit set in the successiveapproximation routine. In addition, when the Preset signal 161 isutilized, the CAL/SQUELCH signal does not reset all of the bits in theoffset register 26. The value in the register is maintained such thatthe search can proceed in a shorter time.

The calibration control circuit 40, as described above, is operable togenerate the CAL/SQUELCH signal in response to an external reset signal.In addition, the calibration control signal 40 is operable to beconnected to the digital input 118 and detect when all of the bitsthereof are at a logic "0" for a predetermined period. In thiscondition, the calibration control circuit 40 generates the CAL/SQUELCHsignal. In this manner, a low noise grounded output is provided wheneverthe DAC output is at a true zero input value. Whenever this mode isentered, the calibration control 40 is operable to reset the bitposition counter 156 such that the calibration does not start from azero offset value. Rather, it starts from an offset value that isslightly less than the previously stored offset value in offset register26. In this manner, it is not necessary to go through the entire binarysearch provided by the bit control circuit 154, but rather through amodified search.

Although the above calibration procedure was described with reference toa zero offset, the gain of the delta-sigma modulator 16 could beadjusted. This would require a measurement of two voltages, a lowvoltage and a high voltage, for a known input. The known input could besummed into summing junction 24 through the offset register 26 and thena measurement taken. A calculation could be made and the gain of thedelta-sigma modulator adjusted. This would be very similar to theprocedure described in U.S. Pat. No. 4,943,807, issued to Early, et al.,on July 24, 1990, and assigned to the present assignee, which patent isincorporated herein by reference.

In summary, there has been provided a D.C. calibration system for adigital-to-analog converter. The digital-to-analog converter is placedinto a calibration mode and the input thereof forced to logic "low"state. A known offset voltage is then input to the DAC and the valuethereof varied in a binary search pattern. When the output is at a truezero, this offset value is stored in the register and then summed withthe external input during normal operation. During the calibrationprocedure, the output is disabled and held at a ground voltage level toprovide a low impedance load on the output.

Although the preferred embodiment has been described in detail, itshould be understood that various changes, substitutions and alterationscan be made therein without departing from the spirit and scope of theinvention as defined by the appended claims.

What is claimed is:
 1. A digital-to-analog converter with an integrated calibration system, comprising:a digital-to-analog converter for receiving a digital input signal on a digital input and outputting an analog output signal having an analog output level corresponding to the digital value of said digital input signal; an offset circuit for offsetting said analog output level by an offset value, said offset circuit including:a digital summing junction disposed within said digital-to-analog converter, and an offset register for storing said offset value as a digital value, the output of said offset register input to a digital input of said digital summing junction for summing with a digital signal in the processing path of said digital-to-analog converter; sampling circuitry for sampling the analog output level of said analog output signal of said digital-to-analog converter when a predetermined calibrating digital input signal is input to said digital-to-analog convertor; and register control circuitry for varying said offset value in said offset register until the analog output level of said analog output signal is substantially equal to a predetermined calibration analog output signal when said predetermined calibrating digital input signal is input to said digital-to-analog convertor.
 2. The system of claim 1, wherein said predetermined calibration digital input signal has a value of substantially zero and said predetermined calibrating analog output signal has a value of substantially zero.
 3. The system of claim 1, and further comprising:an analog output terminal for receiving said analog output signal from said digital-to-analog converter; a disabling circuit for isolating said analog output from said analog output terminal in response to generation of said calibration signal; and a voltage control circuit for disposing said analog output terminal at a predetermined voltage when said analog output terminal is isolated from the output of said digital-to-analog converter by said disabling circuit.
 4. The system of claim 1, wherein said digital-to-analog convertor comprises a delta-sigma digital-to-analog convertor.
 5. A digital-to-analog converter with an integrated calibration system, comprising:a digital-to-analog converter for receiving a digital input signal on a digital input and outputting an analog output signal having an analog output level corresponding to the digital value of said digital input signal, said digital-to-analog converter including: an interpolation filter for increasing the sampling frequency of each digital input signal, a sample and hold circuit for receiving the output of said interpolation filter, a n-bit quantizer for converting the output of said sample and hold circuit to a n-bit digital stream, a n-bit digital-to-analog converter for converting the output of said n-bit quantizer to a converted analog signal, and a low pass analog filter for filtering the output of said n-bit digital-to-analog converter to substantially remove high frequency information therefrom that is outside of the bandwidth of said low pass analog filter; an offset circuit for offsetting said analog output level by an offset value; and a calibration circuit for determining said offset value in response to the generation of a calibration signal, said offset value set by said calibration circuit such that a predetermined digital input value on said digital input will result in the output of a predetermined analog output value.
 6. The system of claim 5, wherein said offset circuit comprises:a digital summing junction disposed between said sample and hold circuit and said quantizer; and an offset register for storing said offset value as a digital value, the output of said offset register input to the second input of said summing junction for summing of said offset value with said digital signal output by said sample and hold circuit.
 7. The system of claim 5, wherein said n-bit quantizer comprises a delta-sigma modulator.
 8. A digital-to-analog converter with an integrated calibration system, comprising:a digital input for receiving a digital input signal; an interpolation section for receiving said digital input signal and increasing the sampling frequency thereof, and a quantizer for receiving the output of said interpolation section and converting it to a digital stream; a digital-to-analog convertor for converting the digital stream into a converted analog signal; an analog section including an analog low pass filter for filtering the converted analog signal output by said digital-to-analog converter and outputting an analog output signal to an analog output node; an offset register for storing a digital offset value; a summing junction for summing said offset value stored in said offset register with said digital input signal prior to input of said digital signal to said quantizer; a calibration circuit for determining said offset value in response to generation of a calibration signal, said offset value set by said calibration circuit such that a predetermined digital input value on said digital input will result in the output of a predetermined analog output value when said predetermined digital input value is summed with said offset value by said summing junction.
 9. The system of claim 8, wherein said summing junction is disposed between said interpolation section and said quantizer.
 10. The system of claim 8, wherein said quantizer is comprised of a delta-sigma modulator and outputs a one-bit digital stream.
 11. The system of claim 8, wherein said interpolation section comprises:an interpolation filter utilizing a finite impulse response filter function operating in accordance with predetermined coefficients for said finite impulse response filter function; and a sample and hold circuit for sampling the output of said interpolation filter and increasing the sampling frequency thereof.
 12. The system of claim 8, wherein said analog filter section comprises:a switched capacitor low pass filter for receiving the output of said digital-to-analog converter; and a continuous time low pass filter for receiving the output of said switched capacitor filter, the output of said continuous time filter connected to said analog output node.
 13. The system of claim 8, wherein said calibration circuit comprises:means for forcing said digital input signal to a predetermined calibrating digital input signal; a sampling circuit for sampling the analog output level of said analog output signal that is output by said analog section; and register control circuitry for varying said offset value in said offset register until the analog output level of said analog output is substantially equal to a predetermined calibrating output signal when said predetermined calibrating input signal is input as said digital input signal.
 14. The system of claim 13, wherein said predetermined calibrating digital input signal has a value of substantially zero and said predetermined calibrating analog output signal has a value of substantially zero.
 15. The system of claim 13, and further comprising:an disabling circuit for isolating said analog output node from the output of said analog low pass filter in response to generation of said calibration signal; and a voltage control circuit for placing said analog output node at a predetermined voltage, said analog output node is isolated from the output of said analog low pass filter and said analog section by said disabling circuit.
 16. The method of claim 13, wherein said register control circuitry is operable to vary the offset value of said offset register by a binary search algorithm, and latch the value of said offset value in said offset register when said analog output signal is substantially equal to said predetermined calibrating analog output signal.
 17. The system of claim 8, and further comprising means for generating said calibration control signal in response to an external input signal.
 18. The system of claim 8, and further comprising means for generating said calibration signal in response to said digital input signal having a predetermined value.
 19. A method for calibrating a digital-to-analog converter, comprising the steps of:providing a digital input terminal; providing an analog output terminal; converting a digital input signal received on the digital input terminal to an analog output signal on the analog output terminal, the analog output level of the analog output signal corresponding to the digital value of the digital input signal; offsetting the analog output level by an offset value, the step of offsetting including the steps of:sampling the analog output level of the analog output signal when the digital input signal is disposed at a predetermined calibrating input signal; and varying the offset value until the analog output level of the output signal is substantially equal to a predetermined calibrating analog output signal when the digital input signal is forced to the predetermined calibrating input signal; determining the offset value in response to generation of a calibration signal such that a predetermined digital input value on the digital input terminal will result in the output of a predetermined analog output value on the analog output terminal.
 20. The method of claim 19, wherein the predetermined calibrating digital input signal has a value of substantially zero and the predetermined calibrating analog output signal has a value of substantially zero.
 21. The method of claim 19, and further comprising:isolating the analog output signal from the analog output terminal in response to generation of the calibration signal; and placing the analog output terminal at a predetermined voltage when the analog output terminal is isolated from the analog output signal by the step of isolating.
 22. A method for calibrating a digital-to-analog converter, comprising the steps of:providing a digital input terminal; providing an analog output terminal; converting a digital input signal received on the digital input terminal to an analog output signal on the analog output terminal, the analog output level of the analog output signal corresponding to the digital value of the digital input signal;, the step of converting including the steps of:filtering the digital input signal through an interpolation filter to increase the sampling frequency thereof; processing the output of the interpolation filter through a sample and hold circuit; converting the output of a sample and hold circuit to a n-bit digital stream; converting the n-bit digital stream to a converted analog signal; and filtering the converted analog signal with a low pass analog filter to substantially remove high frequency information therefrom that is outside the bandwidth of the low pass analog filtering step; offsetting the analog output level by an offset value; and determining the offset value in response to generation of a calibration signal such that a predetermined digital input value on the digital input terminal will result in the output of a predetermined analog output value on the analog output terminal.
 23. The method of claim 22, wherein the step of offsetting comprises:providing an offset register; storing the offset value as a digital value in the offset register; and summing the output of the offset register with the digital signal output by the sample and hold circuit, and prior to converting the output of the sample and hold circuit to the n-bit digital stream.
 24. The method of claim 22, wherein the step of converting the output of the sample and hold circuit to a n-bit digital stream comprises processing the output of the sample and hold circuit through a delta-sigma modulator.
 25. A method for calibrating a digital-to-analog converter, comprising the steps of:receiving a digital input signal on a digital input; increasing the sampling frequency of the digital input signal; converting the digital signal with the increased sampling frequency to a n-bit digital stream; converting the n-bit digital stream to a converted analog signal; providing an analog low pass filter; filtering the converted analog signal through the analog low pass filter; providing an offset register; storing in the offset register a digital offset value; summing the digital offset value stored in the offset register with the digital input signal prior to conversion of the digital input signal to the n-bit digital stream; and determining the offset value in response to generation of a calibration signal, the offset value set such that a predetermined digital input value on the digital input will result in the output of a predetermined analog output value.
 26. The method of claim 25, wherein the step of summing comprises summing the output of the offset register with the digital signal after the sampling frequency thereof has been increased and prior to converting the digital signal to the one-bit digital stream.
 27. The method of claim 25, wherein the step of converting the digital signal with the increased sampling frequency to a one-bit digital stream comprises processing the digital signal with the increased sampling frequency through a delta-sigma modulator.
 28. The method of claim 25, wherein the step of increasing the sampling frequency comprises:processing the digital input signal through an interpolation filter which processes the digital signal with a finite impulse response function; and processing the output of the interpolation filter through a sample and hold circuit.
 29. The method of claim 25, wherein the step of determining the offset value comprises:forcing the digital input signal to a predetermined calibrating digital input signal; sampling the analog output level of the analog output signal output from the analog low pass filter when the digital input signal is forced to the predetermined calibrating digital input signal; and varying the offset value stored in the offset register until the analog output level of the analog output signal is substantially equal to a predetermined calibrating analog input signal when the digital input signal is forced to the predetermined calibrating digital input signal.
 30. The method of claim 24, wherein the predetermined calibrating digital input signal has a value of substantially zero and the predetermined calibrating analog output signal has a value of substantially zero.
 31. The method of claim 24, and further comprising:providing an analog output terminal for receiving the analog output signal from the analog low pass filter; isolating the analog output signal from the analog output terminal in response to generation of the calibration signal; and placing the analog output terminal at a predetermined voltage when the analog output terminal is isolated, by the step of isolating. 